Highly-reliable Integrated Circuits for Ground and Space Applications
نویسنده
چکیده
This paper deal with highly-reliable integrated circuits for ground and space applications especially strong against soft errors. In the terrestrial region, neutrons and alpha particles are main sources to cause soft errors. They flip contents of storage cells such as SRAMs and flip flops on a semiconductor chip. Soft errors must be considered for semiconductor chips for security, automotive, avionics, cloud servers, social infrastructure and so on that are critical for safety and serviceability. In outer space, heavy ions are main sources to cause soft errors.
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